Eindhoven
28 October 2026

ePicture This 2026

Eindhoven
28 October 2026

Information

The fourth edition of ePicture This event will take place on 28 October 2026 at TU Eindhoven, building on the strong momentum of previous editions that have made it a key meeting point for the European imaging community.

Since its launch in 2023, ePicture This has steadily grown, attracting an engaged community of experts from leading organisations such as ASML, imec, Philips, Teledyne, TNO, TU/e and fostering high-quality discussions at the intersection of AI, sensor technologies and advanced imaging systems. This year’s edition expands beyond a project-focused workshop into an AENEAS Technical Day, organised by core partners from the Xecs projects ELEVATION and ENTERTAIN in close collaboration with AENEAS. This evolution reflects a wider ambition to connect projects, industry and research within the European semiconductor ecosystem, while maintaining the event’s strong technical depth.

The 2026 programme will feature:

  • Three high-level keynote sessions structured around Processing, Capturing and Application
  • Technical contributions from industry, academia and EU collaborative projects 
  • Renowned speakers from large companies, innovative SMEs and research institutions
  • A strong focus on cutting-edge developments in imaging, AI and semiconductor-enabled applications


Beyond the technical content, this event is known for its interactive and dynamic atmosphere, where networking moments play a central role, offering valuable opportunities to exchange ideas, spark collaborations and connect across the European ecosystem.

The day will conclude with a Presentation Award and informal networking drinks, continuing a tradition that makes ePicture This not only insightful but also highly engaging and community-driven.

Want to know what to expect or revisit the highlights from previous editions?

Presentations and key takeaways are available here:



Location

Eindhoven University of Technology (TU Eindhoven)
De Zaale
5612 Eindhoven
Corona zaal

Programme

28 October 2026
08:30 to 09:00

Registration


09:00 to 09:20

Welcome address & Opening

Welcome by Caroline Bedran, AENEAS 

Opening by Marcel Dijkema, Sioux Technologies; Egor Bondarev, TU/e; Klaas Jan Damstra, Grass Valley

09:20 to 10:00

Keynote presentation #1 PROCESSING: Situational Awareness: Inside Out with CGI Indoor Explorer

by Bart-Peter Smit and Max van Schendel, CGI Nederland B.V.

Abstract and bio.

10:00 to 10:50

Technical Presentations

  • 10:00 – 10:25 Seeing the Unseen: Real-Time 3D World Reconstruction – From Static Scenes to Dynamic SLAM by Yasaman Kashefbahrami, Eindhoven University of Technology. Abstract & Bio
  • 10:25 – 10:50 Bridging neural rendering and classical computer graphics by Anthony Cioppa, Liege University, Belgium. Abstract & Bio
10:50 to 11:10

Coffee Break


11:10 to 12:00

Technical presentations

  • 11:10 – 11:35 From Pixels to Possibilities: Generative AI for Application-Tailored Synthetic Imaging by Christiaan Viviers & Francisco Caetano, Eindhoven University of Technology. Abstract & Bio
  • 11:35 – 12:00 NeuronFlow: Low-power Low Latency AI for Responsive See-through AR by Orlando Moreira, Snap BW. Abstract

12:00 to 12:40

Keynote presentation #2 CAPTURING: Is The Perfect CMOS Image Sensor Available Today?

by Albert Theuwissen, Harvest Imaging 

Abstract & Bio.

12:40 to 13:30

Lunch & Networking


13:30 to 13:55

Technical Presentations

  • World's first filter-free color splitting image sensor: from concept to silicon to first results by Stijn Awouters, Eyeo, Netherlands. Abstract & Bio

    13:55 to 14:20

    Technical Presentations

    • Low-Temperature Integration of SiGe-on-Si using Aluminum-Induced Crystallization for Advanced Optical and Electronic Sensors by Lucia Crocetto, Delft Technical University. Abstract & Bio


     

    14:20 to 15:00

    Keynote presentation #3 APPLICATION: Towards Robust Imaging with Radars

    by Tunc Alkanat, NXP Semiconductors. Abstract & bio. 

    15:00 to 15:20

    Coffee break & Networking


    15:20 to 16:35

    Technical Presentations

    • 15:20 – 15:45 You should never see an image: event-based vision from the maths up by Oksana Manyuhina, Sioux Technologies, Netherlands. Abstract & Bio
    • 15:45 – 16:10 Advanced Measurement Techniques in Digital Pathology by Dávid Tátrai, 3Dhistech. Abstract
    • 16:10 – 16:35 High-Resolution 3D X-ray inspection of advanced packaging semiconductor devices by Till Dreier, Excillum, Sweden. Abstract & Bio

    16:35 to 16:45

    Closing


    16:45 to 17:30

    Networking Cocktails & Presentation Award


    More

    Please note that participation is free of charge, but registration is required as places are limited. If your plans change and you are no longer able to attend, we kindly ask you to cancel your registration to allow another participant to join.

    New to the AENEAS Events Platform? Kindly note that some time is required for the account verification and you will receive an email confirmation.

    If you are interested in presenting your technical developments in Capturing, Processing or Application Imaging, please upload your abstract, using the template available in the AENEAS Events Platform, in the Project Idea section. Kindly note that the registration is required.




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